Encoded photometric infrared spectroscopy patent

Edited by the Processingtalk editorial team Jan 11, 2006

Aspectrics announces its fifth US Patent for encoded-photometric infrared technology, which will enable real-time, parts-per-billion monitoring of chemical components in industrial processes

Aspectrics, a leading supplier of Encoded Photometric Infrared Spectroscopy (EP-IR) analysers, today announced the receipt of a fifth US patent for its Encoded Photometric Infrared Spectroscopy disc technology and associated optics.

The new patent number 6,982,788 was filed May 29th, 2000, and issued January 3rd, 2006.

"This patent further strengthens the Aspectric EP-IR encoded disc technology and will allow Aspectrics to develop and deliver new EP-IR products to the marketplace in a more timely manner", said Paul Salsgiver Jr, CEO of Aspectrics.

Aspectrics continues to file additional patent applications covering its fundamental technology to cover recent improvements and variations on the various systems; additional markets where the company may most effectively leverage its technology; and those features most often requested by its customers.

The company has dozens of patent applications currently pending and will bolster its portfolio with further filings, from its intellectual property counsel Fenwick and West.

Aspectrics EP-IR technology enables real-time, parts-per-billion monitoring of dozens of chemical components under hostile environmental conditions commonly found in industrial processes.

Applications under development by Aspectrics OEM customers using its EP-IR technology include ambient air and stack gas monitoring, engine emission analysis, foods and semiconductor processes.

At the heart of the Aspectrics EP-IR analyser is a rotating disc onto which up to 256 concentric encoding tracks are used to encode dispersed radiation, which is then collected and imaged onto a single-channel detector.

The compact design enables very precise intensity measurements under hostile environmental conditions, which enables EP-IR to replace conventional analyser technologies such as NDIR and FTIR currently used in many process monitoring and control applications.