Product category:
Liquid Analysis: Spectroscopy, Colour
News Release from: Aspectrics | Subject: EP-NIR analyser
Edited by the Processingtalk Editorial
Team on 06 November 2006
New EP-NIR Analyser on show at PITTCON
2007
Aspectrics, the innovator of patented Encoded Photometric Infrared (EP-IR) spectroscopy technology, announces the launch of its new Encoded Photometric Near Infrared (EP-NIR) analyser.
Aspectrics, the innovator of patented Encoded Photometric Infrared (EP-IR) spectroscopy technology, has launched a new Encoded Photometric Near Infrared (EP-NIR) analyser This novel near-infrared MultiComponent 2750 analyser achieves an impressive spectral range of 1375-2750nm and an ultra fast scan speed of 100scans/second
This article was originally published on Processingtalk on 6 Sep 2007 at 8.00am (UK)
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Designed to enable users in the process industry to monitor their processes in real time, this new Aspectrics EP-NIR analyser will be showcased on booth 4417 at PITTCON 2007 in Chicago at the end of February 2007.
Also on display will be the Aspectrics award-winning EP-IR analysers.
Recently presented with the R+D Top 100 Award, the Aspectrics EP-IR MultiComponent Analyser has been recognised as one of the top 100 most technologically significant products introduced into the marketplace in 2006.
The EP-IR MultiComponent Analyser was noted at the awards for its impressive spectral range, its 128 photometric channels and the fast scan rate of 100scans/second.
Additionally, Aspectrics innovative analysers include a standard suite of software solutions, resulting in quicker and more efficient real-time data acquisition, as well as instrument control, data play back and quantitation.
Aspectrics innovative EP-IR analysers have recently achieved military 202G Method 204D certification for successfully passing the High Frequency resistance test.
The test was performed to determine the effect of vibration on component parts of the analysers in frequency ranges of 0.5 to 30 Hz.
The units demonstrated no degradation in performance during or after the test compared to traditional Fourier Transform Infrared (FT-IR) systems.
To view a video demonstrating this experiment, please visit the Aspectrics website.
For more information about Aspectrics and the EP-IR or EP-NIR technology, please visit booth 4417 at PITTCON 2007, or request more information now.
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