Handbook for Parametric Parallel Test

Keithley Instruments, a leader in solutions for emerging measurement needs, has published 'Parallel Test Technology: The New Paradigm for Parametric Testing' a semiconductor parametric test handbook

Keithley Instruments, a leader in solutions for emerging measurement needs, has published 'Parallel Test Technology: The New Paradigm for Parametric Testing', a semiconductor parametric test handbook.

The 60-page handbook offers an overview of the emerging test technique known as parallel parametric testing, a strategy for wafer-level parametric testing that uses concurrent execution of multiple tests on multiple scribe line test structures and helps semiconductor fabs maximise their test throughput and reduce their cost of test.

The handbook is available for no charge via the website.

The handbook covers:.

The basics of parallel parametric test.

The parallel test implementation process.

Applying parallel parametric test to existing hardware setups.

Test structure design for parallel testing.

The Keithley Parallel Test Technology handbook also contains a section with sample programming code for a typical parallel test set-up using pt_execute, and a glossary of common parallel parametric test terminology.

To request a free copy of the Parallel Test Technology handbook or for more information on the Keithley semiconductor parametric test and measurement systems, data acquisition products, or test and measurement solutions, visit the website or contact the company direct.

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