Product category:
Test equipment
News Release from: Keithley Instruments | Subject: S600 Series
Edited by the Processingtalk Editorial
Team on 27 July 2007
Linux-based Parametric Test Systems
introduced
Keithley Instruments, a leader in solutions for emerging measurement needs, announces a group of enhancements for its S600 Series Parametric Test Systems
The main enhancement is a migration to the Linux Operating System (OS) on the embedded control computer within each test system This provides a more stable OS and longer service life for the computer, reducing the need for customers to qualify new workstations and upgrade software and hardware resources
This article was originally published on Processingtalk on 30 Jul 2008 at 8.00am (UK)
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With its RF and parallel test options and appropriately designed test structures and probe cards, the Model S680 is the only RF test system on the market that can make simultaneous DC and RF measurements in parallel within the same probe touchdown.
This yields substantially higher throughput than similar methods that perform sequential DC measurements followed by RF measurements.
The Model S680 system using the new Linux controller will be compatible on a mixed system test floor.
For customers who prefer a 100 percent Linux test floor, field upgrades are available.
In any case, a newly installed Linux controller will operate seamlessly with existing parametric test systems operating under Solaris.
For example:.
* Recipes - Format and content are the same for those using Keithley Recipe Manager.
* User Library Source Code - The same source files are usable on the new platform.
* KTXE - Both platforms use the same engine.
Those purchasing the new Keithley S600 Series systems will get the latest software version, KTE V5.2.2, which is also available as a field upgrade.
The new systems will have Red Hat Enterprise Linux WS Version 4, Update 4, and a new x86-based computer.
Aside from the RF and parallel test options, these systems can also be purchased with the adaptive test option and 300mm wafer automation option.
Because the GUI is similar to that in earlier systems, minimal, if any, additional operator training is needed.
For a customised quote on a new system or field upgrades, contact the Keithley factory for the specific configuration you have in mind.
Upgrades and new systems will be available for delivery starting September 2007.
For more information on the Keithley S600 Series Parametric Test Systems, or any of its semiconductor test solutions, visit the website. Request a free brochure from Keithley Instruments ...
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