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Product category: Powder, droplet and particle characterisation
News Release from: Malvern Instruments | Subject: Keynote lecture
Edited by the Processingtalk Editorial Team on 20 July 2006

On-line particle sizing for process
control

Susan Aberle, project manager for the Malvern Instruments on-line particle size analysis group, will be a keynote speaker at the forthcoming conference 'Control of Particulate Processes VII'

Malvern Instruments project manager to give keynote lecture Susan Aberle, project manager for the Malvern Instruments on-line particle size analysis group, will be a keynote speaker at the forthcoming conference 'Control of Particulate Processes VII' The conference, which will focus on intelligent sensing and control as the path to manufacturing excellence, takes place from 29 October to 2 November 2006 at Harrision Hot Springs, in Canada

Dr Aberle's presentation will cover the use of on-line particle sizing for process control.

Manufacturing processes for particulates and solids are acknowledged as presenting greater processing challenges than either liquids or gases, and this conference takes place against the backdrop of increased investment in enabling techniques for improving product manufacturing performance.

With developments such as the FDA PAT initiative, the trend is for all materials properties ultimately to be characterised on-line or at-line.

The conference provides a forum for reviewing state-of-the-art developments in particulate process measurement, control and modelling.

For more information about Malvern materials characterisation products please consult the website. Request a free brochure from Malvern Instruments ...

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