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Product category: Powder, droplet and particle characterisation
News Release from: Malvern Instruments
Edited by the Processingtalk Editorial Team on 15 September 2006

Malvern software to be used on FEI
Quanta SEM

Note: A free brochure or catalogue is available from Malvern Instruments about its services. Click here to request a copy.

The FEI Quanta SEM and the Malvern Advanced Particle Analysis Software are being combined to deliver a ground-breaking solution for nanoscale applications

The FEI Company and Malvern Instruments have entered into a joint development and marketing programme for advanced nanoparticle analysis utilising Malvern particle image analysis software on the FEI line of Quanta scanning electron microscopes (SEMs) The combination delivers a powerful particle analysis solution that extends current analysis technologies for nano-sized particles

FEI Quanta SEM units offer users the flexibility to analyse materials without imposing many of the traditional SEM sample preparation constraints, thereby greatly extending the applicability for particle analysis.

Malvern particle image analysis software will be optimised for the FEI Quanta SEMs.

A proven solution, this package is already used on Malvern systems that encompass traditional optical microscopes, such as the Morphologi G2, with many research and industrial users around the world.

These systems provide rapid data on particle size and morphology and yield distribution profiles for quality control and manufacturing applications.

Rationalising batch to batch variation of materials, identifying crystal polymorphisms and the identification of foreign bodies are just some of the current applications.

"As the size of materials used in product development and manufacturing continues to move from the microscale into the nanoscale there is an increasing need for characterisation tools that move beyond the limits of light microscopy," commented Matt Harris, FEI vice president of worldwide marketing and business development.

"This combination of FEI and Malvern technologies provides a powerful process and quality control tool for a growing number of nano-enabled products that are moving into production".

The Malvern Business Development Director, Duncan Roberts, said: "The joint venture with FEI is an exciting development, as this is the first time that Malvern software has been applied to another company's instrumentation.

Already proven with light microscopy, the execution of this solution on FEI systems provides SEM users with a powerful new tool".

The bundled solution will be released later this year.

It will be actively promoted to current and potential customers of both FEI and Malvern Instruments.

The FEI tools for nanotechnology, featuring focused ion and electron-beam technologies, deliver 3D characterisation, analysis and modification capabilities with resolution down to the sub-Angstrom level and provide innovative solutions for customers working in nanobiology, nanoresearch and nanoelectronics.

With R+D centres in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers and helping to turn some of the biggest ideas of this century into reality. Request free introductory details about products from Malvern Instruments ...

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