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Micro-Epsilon will showcase sensors at Mtec 2009

A Micro-Epsilon product story
Edited by the Processingtalk editorial team Jan 16, 2009

Micro-Epsilon (UK) will give live working demonstrations of new sensor products at this year's Mtec, to be held 25-26 March 2009.

These products include the Scancontrol 2700, a non-contact laser profile displacement sensor.

Micro-Epsilon PI Process Imager

Micro-Epsilon PI Process Imager

The Scancontrol 2700 has a controller integrated in the sensing head, making it compact.

The Scancontrol 2700 has multiple interface options that enable ease-of-use in a variety of software platforms.

The compact design makes the unit ideal for industrial automation tasks and machine building applications, where space is often restricted.

Typical uses include the measurement of angles, channels, gaps, edge detection and clearance; weld seam inspection; detection of beads of adhesive; robot guidance and positioning; groove width and depth measurement.

The measurement range can be programmed from 10, 25 and 100mm, up to 600mm.

The Micro-Epsilon PI (Process Imager) is an inline radiometric thermal imaging device that provides temperature images and profiles of a target area.

It measures 45 x 45 x 62mm and weighs just 250g, including lens and 1m USB cable, enabling easy mounting in restricted spaces.

The camera is protected to IP65 (NEMA-4) and is powered (5V DC) via the USB 2.0 interface, with a maximum current draw of 500mA.

Free software is included that enables users to configure all the adjustable parameters of the PI and capture (up to 100Hz full frame rate) and store images or an event for play back at a later date.

The Micro-Epsilon PI can be fixed into position in a production process or research and development lab to monitor the temperature profile of target materials or objects.

Micro-Epsilon's LL (laser line) series of sensors use custom spot geometry and patented software algorithms to filter out noise from difficult-to-measure surfaces.

The CapaNCDT 6500 is a non-contact, multi-channel capacitive measurement system that offers sub-nanometre resolution.

The series is available as a benchtop or 19-in rack-mounted unit and offers temperature stability of 5ppm/C for the controller and 11ppm/C for the sensor.

Rapid changeover of sensors can be achieved without re-calibration.

One difficulty with high resolution measurements is the transmission of data through analogue output channels to the user's acquisition system.

Signal noise caused by cable interconnects and earthing loops often results in reduced system performance.

Internally converting the analogue signal to a digital Ethernet output in the CapaNCDT 6500 controller eliminates this problem.

It also allows the signal to be transmitted to another IP address anywhere in the world.

The CapaNCDT 6500 can accept up to eight measuring channels to suit individual customer requirements.

It is suitable for high-accuracy research and development applications, test laboratories, quality assurance, academic institutions and semiconductor manufacturing, military, aerospace and defence applications.

Find out more about this article. Request a brochure, download technical specifications and request samples here.

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