Product category:
Exhibitions on processing and instrumentation
News Release from: Mettler Toledo
Edited by the Processingtalk Editorial
Team on 01 March 2007
Mettler Toledo is to feature at Total
2007
The Mettler Toledo Product Inspection Division will be on show at the Total Exhibition in the NEC, featuring metal detection, X-ray and checkweighing equipment, as well as weigh-price labellers
The Mettler Toledo Product Inspection Division will be exhibiting their full range of product inspection technology, including metal detection, X-ray and checkweighing equipment, as well as industrial weigh price labellers, at Total 2007 Visitors to Stand 4560 can see a wide range of Mettler Toledo solutions, including the latest "Profile" metal detector designed and built for sensitivity, reliability and ease of use
This article was originally published on Processingtalk on 11 Jul 2008 at 8.00am (UK)
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The range includes detectors for conveyor-fed, gravity-fall, pipeline and pharmaceutical applications.
Also see demonstrations of X-ray inspection systems featuring industry-leading detector and image processing technology, simple set-up and user-friendly, intuitive operator interfaces.
The new X-Series Checkweigher will take pride of place on the weighing side, shown for the first time in the UK; the X-Series features incredible levels of accuracy, 15'' full colour display with a USB download facility to make data retrieval fast and simple.
Also on display, Weigh Price Labelling technology, which offers static and automated solutions for both manual and high-speed pre-pack applications.
Mettler Toledo will be at the Total Exhibition on Stand 4560, Hall 4 at the NEC, Birmingham from 15 -18 May 2007. Request free introductory details about products from Mettler Toledo ...
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