Product category:
Conferences and Seminars relevant to Processing
News Release from: National Instruments | Subject: NIDays
Edited by the Processingtalk Editorial
Team on 14 December 2006
National Instruments host NIDays 2006 at
IET
During October, National Instruments hosted NIDays 2006, its annual professional development conference and exhibition for engineers and scientists, in association with the IET, at Savoy Place, London
During October, National Instruments UK and Ireland hosted NIDays 2006, its annual professional development conference and exhibition for engineers and scientists, in association with the IET (Institution of Engineering and Technology - Europe's largest professional engineering society), at Savoy Place, their prestigious central London headquarters Hundreds of engineers, scientists and industry experts from across the UK and Ireland - including representatives from AWE, Dyson, Motorola, Renishaw and Rutherford Appleton Laboratory - gathered at this one-day, multi-track event to learn about the latest developments in graphical system design and virtual instrumentation
This article was originally published on Processingtalk on 15 Oct 2007 at 8.00am (UK)
Related stories
NIDays 2007: Savoy Place, 25 October
Register now for NIDays 2007, the annual professional development conference and exhibition for engineers and scientists involved in test and measurement, industrial control and automation
National Instruments announces NIDays 2007
Registrations are open for attendance at the annual professional development conference and exhibition for engineers and scientists, in association with the Institution of Engineering and Technology
Industry experts and fellow users described how to increase productivity and lower cost by combining off-the-shelf technologies with innovative software and modular hardware using this unique approach to embedded design, industrial control, and test and measurement.
NIDays delivered hands-on training and in-depth technical sessions covering the latest in test, control and design - including new National Instruments LabVIEW 8.20, the 20th Anniversary edition of its award-winning graphical system design software, and NI CompactDAQ, its new USB data acquisition platform.
During the conference, delegates networked and exchanged ideas on innovative approaches to technical challenges, studied future industry and technology trends for engineers and scientists designing test and control systems, and explored three core technology themes: software development technologies; data acquisition, instrumentation and test; and real-time control.
Further reading
NI day for learning about virtual instrumentation
Learn more about virtual instrumentation, measurement and automation at NIDays 2006, the UK's 10th annual conference hoisted by NI in association with the IET, on 31 October
National Instruments explains LabVIEW 8.6
National Instruments UK and Ireland invites engineers and scientists to attend the LabVIEW Roadshow for a day of technical sessions and product demonstrations based on NI LabVIEW 8.6.
10 new Wi-Fi and Ethernet data acquisition devices
National Instruments announces 10 new Wi-Fi and Ethernet DAQ devices, extending the world-trusted NI measurement hardware and software platform to wireless remote monitoring applications
During the keynote, Graphical System Design: Design, Prototype and Deploy in Today's World, delegates heard from experts on the hottest industry topics and saw the new Lego Mindstorms NXT - powered by NI LabVIEW - in action.
They also enjoyed seeing an engineer beat up a marketing guy with a baseball bat and were treated to a competitive dance-off competition - all in the cause of graphical system design! A broad range of technical sessions included.
* Machine Monitoring for the Masses: What Your Equipment Wants to Tell You.
* Evaluating PCI Express and Multicore Processor Technology for Test and Measurement.
* Head-to-Head Instrument Control Bus Comparison: GPIB, PCI, PCI Express, USB and Ethernet/LAN.
* New USB Data Acquisition: As Easy as it is Powerful.
* Tips and Tricks to Improve LabVIEW Performance.
* Methods for Benchmarking and Optimising Real-Time Applications.
* Implementing RF and Wireless Communications Applications with LabVIEW.
* Build a Complete Automated Test System from Scratch.
Delegates also sat down informally with qualified consultants to discuss their application in 'Meet the Engineer' sessions; customised their conference experience through introductory, intermediate and advanced sessions; built application development expertise through hands-on workshops such as Introduction to LabVIEW and Introduction to Real-Time; discussed membership, training and professional development with IET personnel; visited the NIDays exhibition, where Technology and Alliance Partners, including Tektronix, Analog Devices, Amfax and Electronics Workbench, were showcased; and joined NI in celebrating the 30 years of National Instruments excellence and 20 years of LabVIEW innovation.
Sessions were filmed by IET.tv for web broadcast and can be viewed, along with the presentations from the day, online. Request a free brochure from National Instruments ...
• National Instruments: contact details and other news
• Email this article to a colleague
• Register for the free Processingtalk email newsletter
• Processingtalk Home Page
Search the Pro-Talk network of sites
