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Rugged, new XRF analyser for elemental analysis

An Oxford Instruments Analytical product story
Edited by the Processingtalk editorial team Aug 15, 2008

Specialist distributors from across the Middle East gathered in Dubai for the Oxford Instruments highly successful launch of their next generation, X-ray Fluorescence analyser, the X-MET5000

The X-MET5000 is the first truly rugged hand-held analyser for harsh multi-element analysis.

Engineered for high performance and reliability, this tough, brand new portable XRF analyser combines the patented Oxford Instruments PentaPIN detector technology for guaranteed fast analysis and lower limits of detection.

Built for the most demanding quality control applications - such as scrap metal recycling, analysis of metals for PMI, screening for lead in toys, consumer product RoHS compliance testing - the X-MET5000 also serves the needs of the mining community for ore exploration, as well as the measurement of heavy metals in soils for environmental monitoring.

The X-MET5000 major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of heavy elements, even when the sample contains light elements like aluminium and silicon.

This is not possible when using Fundamental Parameters (FP) on an analyser that does not detect the light elements.

This rugged and reliable tool is IP54 (NEMA3) approved for superior dust and splash protection.

The X-MET5000 is perfect for the harshest environments.

The battery operating time of one working day enables extended productivity.

The powerful user programmable software delivers highly accurate results for reliable Go/No-Go decisions.

The X-MET5000 will identify material type and automatically choose the best analysis method.

An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.

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