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News Release from: Thermo Fisher Scientific (Microanalysis) | Subject: UltraDry
Edited by the Processingtalk Editorial
Team on 08 August 2007
Silicon drift detector for electron
microscopes
Thermo Fisher Scientific has unveiled their new and improved large-area 'UltraDry' silicon drift detectors with low energy detection capabilities down to Beryllium
The UltraDry detector has enhanced capabilities allowing for detection of very low energy X-rays down to Beryllium The new detector will be showcased on the Thermo Scientific booth #1712 at Microscopy and Microanalysis 2007, in the Broward County Convention Centre, in Florida, from August 5-9
This article was originally published on Processingtalk on 6 Aug 2008 at 8.00am (UK)
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Enhancements to the silicon drift sensor in the new UltraDry detector make excellent low energy detection performance possible.
The resulting clear peak separations in the low energy region allow for easier interpretation of spectra and exceptional confidence in the analysis.
As a silicon drift detector, the UltraDry has X-ray detection performance that is able to collect data at extremely high count rates without sacrificing energy resolution or light element sensitivity.
The UltraDry detector, coupled with the Noran System Six and Direct-to-Phase (DTP) software, enables the quick and accurate determination of compounds and identification of where they are located within the sample.
The Noran System Six microanalysis system, featuring the silicon drift detectors, addresses the needs of the electron microscopist in the area of microelectronics and semiconductor manufacture, alloys and metals analysis, geology, forensic science, failure analysis and academic research.
For more information on the Thermo Scientific Noran System Six ultra-fast X-ray microanalysis system, please visit booth #1712 at Microscopy and Microanalysis 2007.
Alternatively, please visit the website.
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